The motion of the tip when producing images with this technique determines whether it is described as contact or tapping mode. For 10 points each:
[10h] Name this technique used to produce extremely high resolution images. The deflection of a laser beam is used to measure how much the tip of a cantilever moves in this technique.
ANSWER: atomic force microscopy [or AFM; accept scanning force microscopy or SFM; prompt on microscopy; prompt on scanning probe microscopy; reject “electron microscopy”]
[10m] The scanners in atomic force microscopes have this property. Occurring only in crystals with no inversion symmetry, materials with this property produce a potential difference when subject to mechanical stress.
ANSWER: piezoelectric [accept piezoelectricity; accept piezoelectric effect]
[10e] Cantilevers made of this mineral can be used in piezoelectric detection. This mineral is used in watches and is composed of silicon dioxide.
ANSWER: quartz
<Physics>