Question

The motion of the tip when producing images with this technique determines whether it is described as contact or tapping mode. For 10 points each: 
[10h] Name this technique used to produce extremely high resolution images. The deflection of a laser beam is used to measure how much the tip of a cantilever moves in this technique.
ANSWER: atomic force microscopy [or AFM; accept scanning force microscopy or SFM; prompt on microscopy; prompt on scanning probe microscopy; reject “electron microscopy”]
[10m] The scanners in atomic force microscopes have this property. Occurring only in crystals with no inversion symmetry, materials with this property produce a potential difference when subject to mechanical stress.
ANSWER: piezoelectric [accept piezoelectricity; accept piezoelectric effect] 
[10e] Cantilevers made of this mineral can be used in piezoelectric detection. This mineral is used in watches and is composed of silicon dioxide.
ANSWER: quartz
<Physics>

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Summary

2024 ACF Fall at CornellfallY815.00100%38%13%
2024 ACF Fall at Ohio StatefallY813.75100%38%0%
2024 ACF Fall at WashingtonfallY618.33100%67%17%
2024 ACF Fall at GeorgiafallY1013.00100%30%0%
2024 ACF Fall at North CarolinafallY914.4489%33%22%
2024 ACF Fall at Claremont CollegesfallY522.00100%80%40%
2024 ACF Fall at RutgersfallY717.14100%43%29%
2024 ACF Fall at IllinoisfallY920.00100%67%33%

Data

Emory OxfordAuburn A0101020
Tennessee AAuburn B001010
FurmanAuburn C001010
BelmontTennessee B001010
Clemson AGeorgia A0101020
Clemson BGeorgia Tech C001010
Georgia Tech EGeorgia Tech A001010
Alabama ASouthern001010
South Carolina BVanderbilt A0101020
Emory ASouth Carolina A001010