Question

The motion of the tip when producing images with this technique determines whether it is described as contact or tapping mode. For 10 points each: 
[10h] Name this technique used to produce extremely high resolution images. The deflection of a laser beam is used to measure how much the tip of a cantilever moves in this technique.
ANSWER: atomic force microscopy [or AFM; accept scanning force microscopy or SFM; prompt on microscopy; prompt on scanning probe microscopy; reject “electron microscopy”]
[10m] The scanners in atomic force microscopes have this property. Occurring only in crystals with no inversion symmetry, materials with this property produce a potential difference when subject to mechanical stress.
ANSWER: piezoelectric [accept piezoelectricity; accept piezoelectric effect] 
[10e] Cantilevers made of this mineral can be used in piezoelectric detection. This mineral is used in watches and is composed of silicon dioxide.
ANSWER: quartz
<Physics>

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Summary

2024 ACF Fall at CornellfallY815.00100%38%13%
2024 ACF Fall at Ohio StatefallY813.75100%38%0%
2024 ACF Fall at WashingtonfallY618.33100%67%17%
2024 ACF Fall at GeorgiafallY1013.00100%30%0%
2024 ACF Fall at North CarolinafallY914.4489%33%22%
2024 ACF Fall at Claremont CollegesfallY522.00100%80%40%
2024 ACF Fall at RutgersfallY717.14100%43%29%
2024 ACF Fall at IllinoisfallY920.00100%67%33%

Data

Michigan State B CWRU A (UG) 001010
CWRU C (UG)Michigan B (UG)001010
Michigan D (UG)Miami A (UG) 001010
Miami B (UG) Miami C (DII) 0101020
CWRU B (DII) Michigan A (UG) 0101020
Michigan C Michigan State A 0101020
Ohio State A (UG) Ohio State C (DII) 001010
Ohio State B (DII) West Virginia A (UG) 001010