Question

The motion of the tip when producing images with this technique determines whether it is described as contact or tapping mode. For 10 points each: 
[10h] Name this technique used to produce extremely high resolution images. The deflection of a laser beam is used to measure how much the tip of a cantilever moves in this technique.
ANSWER: atomic force microscopy [or AFM; accept scanning force microscopy or SFM; prompt on microscopy; prompt on scanning probe microscopy; reject “electron microscopy”]
[10m] The scanners in atomic force microscopes have this property. Occurring only in crystals with no inversion symmetry, materials with this property produce a potential difference when subject to mechanical stress.
ANSWER: piezoelectric [accept piezoelectricity; accept piezoelectric effect] 
[10e] Cantilevers made of this mineral can be used in piezoelectric detection. This mineral is used in watches and is composed of silicon dioxide.
ANSWER: quartz
<Physics>

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Summary

2024 ACF Fall at CornellfallY815.00100%38%13%
2024 ACF Fall at Ohio StatefallY813.75100%38%0%
2024 ACF Fall at WashingtonfallY618.33100%67%17%
2024 ACF Fall at GeorgiafallY1013.00100%30%0%
2024 ACF Fall at North CarolinafallY914.4489%33%22%
2024 ACF Fall at Claremont CollegesfallY522.00100%80%40%
2024 ACF Fall at RutgersfallY717.14100%43%29%
2024 ACF Fall at IllinoisfallY920.00100%67%33%

Data

UNC BAppalachian State B001010
VCUDuke A0101020
UNC CJames Madison A10101030
Liberty ALiberty C001010
NC StateDuke B001010
James Madison BUNC A0000
UNC DAppalachian State A001010
Virginia Tech BLiberty B0101020
Virginia Tech AVirginia1001020