Question
The motion of the tip when producing images with this technique determines whether it is described as contact or tapping mode. For 10 points each:
[10h] Name this technique used to produce extremely high resolution images. The deflection of a laser beam is used to measure how much the tip of a cantilever moves in this technique.
ANSWER: atomic force microscopy [or AFM; accept scanning force microscopy or SFM; prompt on microscopy; prompt on scanning probe microscopy; reject “electron microscopy”]
[10m] The scanners in atomic force microscopes have this property. Occurring only in crystals with no inversion symmetry, materials with this property produce a potential difference when subject to mechanical stress.
ANSWER: piezoelectric [accept piezoelectricity; accept piezoelectric effect]
[10e] Cantilevers made of this mineral can be used in piezoelectric detection. This mineral is used in watches and is composed of silicon dioxide.
ANSWER: quartz
<Physics>
Summary
| 2024 ACF Fall at Cornell | fall | Y | 8 | 15.00 | 100% | 38% | 13% |
| 2024 ACF Fall at Ohio State | fall | Y | 8 | 13.75 | 100% | 38% | 0% |
| 2024 ACF Fall at Washington | fall | Y | 6 | 18.33 | 100% | 67% | 17% |
| 2024 ACF Fall at Georgia | fall | Y | 10 | 13.00 | 100% | 30% | 0% |
| 2024 ACF Fall at North Carolina | fall | Y | 9 | 14.44 | 89% | 33% | 22% |
| 2024 ACF Fall at Claremont Colleges | fall | Y | 5 | 22.00 | 100% | 80% | 40% |
| 2024 ACF Fall at Rutgers | fall | Y | 7 | 17.14 | 100% | 43% | 29% |
| 2024 ACF Fall at Illinois | fall | Y | 9 | 20.00 | 100% | 67% | 33% |
Data
| WashU B | Chicago B | 0 | 10 | 10 | 20 |
| Indiana | Illinois A | 0 | 10 | 10 | 20 |
| Illinois C | Notre Dame B | 0 | 0 | 10 | 10 |
| Iowa A | Purdue C | 0 | 10 | 10 | 20 |
| Northwestern A | Illinois B | 0 | 10 | 10 | 20 |
| Northwestern B | Chicago A | 10 | 10 | 10 | 30 |
| Purdue B | Notre Dame C | 10 | 10 | 10 | 30 |
| Illinois D | SIUE | 0 | 0 | 10 | 10 |
| Purdue A | WashU A | 10 | 0 | 10 | 20 |