Sub-electron volt resolutions and surface termination maps may be acquired by the application of an energy filter in a technique based on this phenomenon which is named in analogy to LEED and LEEM. The readouts for a technique based on this phenomenon may be expressed as the product of the dipole selection rules and the spectral function. A family of techniques that utilize this phenomenon include hemispherical (-5[1])analyzers in their setups that allow for the mapping (15[1])of (15[1])(*) Fermi surfaces. (10[1])A technique based on this phenomenon (10[1])developed by (-5[1])Kai Siegbahn (10[1]-5[1])irradiates a material with a beam of X-rays (-5[1])to obtain (10[1])population spectra. Energies of electrons emitted via this phenomenon must be subtracted from a material’s (10[1])work function (10[4])to measure (10[1]-5[1])electronic (10[2])states. (10[1])For 10 points, name this effect in which electrons are ejected (10[2])from a material when hit with incident light. (10[1])■END■ (10[5]0[1])