Question

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In functional analysis, an artifact is examined for organic residues as well as for traces left behind by this process. For 10 points each:
[10m] Name this damaging tribological process in which material comes off of surfaces that are sliding against each other.
ANSWER: wear [accept use-wear analysis; prompt on friction; prompt on abrasion; reject “wear and tear”]
[10h] This geophysical technique can map artifacts at a higher resolution than electrical resistivity surveys. The interface reflections detected by this technique can be occluded by conductive soils with high clay or salt content.
ANSWER: ground-penetrating radar [or GPR or ground-probing radar; accept subsurface radar or surface-penetrating radar or SPR; prompt on radar or radio detection and ranging]
[10e] For a subsurface artifact modeled as this type of source, the reflected power detected by a radar receiver is proportional to the inverse fourth power of target depth. Geometrical optics assumes that light is emitted from this type of ideal source with negligible dimensions.
ANSWER: point source [accept point scatterer or point reflector]
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Summary

2024 ACF Nationals2024-04-21Y238.2674%9%0%

Data

Johns HopkinsBerkeley A001010
Chicago AWaterloo001010
IndianaChicago B001010
Cornell BChicago D0000
Yale BClaremont Colleges0000
PurdueColumbia A1001020
WUSTL ACornell A001010
BrownGeorgia Tech001010
NorthwesternIowa State0000
IllinoisMaryland001010
McGillTruman State001010
Berkeley BMinnesota B0000
NYUToronto A0000
North Carolina BHarvard001010
Arizona StateOttawa001010
PennFlorida001010
RutgersColumbia B1001020
Chicago CSouth Carolina001010
StanfordNorth Carolina A001010
Minnesota ATexas001010
VirginiaDuke001010
WUSTL BToronto B0000
Yale AMichigan001010