The tapping mode of this technique can be used if there is a risk of damaging the sample by continuous contact. For 10 points each:
[10m] Name this high-resolution microscopy technique that measures the deflection of a cantilever after a sharp tip makes contact with a surface of interest.
ANSWER: atomic force microscopy [or AFM; accept scanning force microscopy or SFM; accept Kelvin probe force microscopy or KPFM or scanning Kelvin probe microscopy or SKPM; prompt on scanning probe microscopy or SPM; prompt on force microscopy]
[10e] Atomic force microscopy can be used to analyze these materials, whose structure can be “single-walled” or “multi-walled.” These materials are essentially a layer of graphene rolled up into a cylinder.
ANSWER: carbon nanotubes [or CNTs or single-walled carbon nanotubes or SWCNTs or multi-walled carbon nanotubes or MWCNTs; prompt on nanomaterials]
[10h] This element and its nitride are the most popular materials used to make cantilevers in atomic force microscopes. That nitride is one of many compounds containing this element that can be deposited by low-pressure chemical vapor deposition.
ANSWER: silicon [or Si; accept silicon nitride]
<Chemistry>